Invention Grant
- Patent Title: CRT test system
- Patent Title (中): CRT测试系统
-
Application No.: US12591469Application Date: 2009-11-20
-
Publication No.: US08179138B2Publication Date: 2012-05-15
- Inventor: Hsiang Chang , Cheng-Hsuan Tsai , Ming-Chang Liu
- Applicant: Hsiang Chang , Cheng-Hsuan Tsai , Ming-Chang Liu
- Applicant Address: TW Taipei Hsien
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW Taipei Hsien
- Agency: Bacon & Thomas, PLLC
- Priority: TW98116794A 20090520
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A cathode ray tube (CRT) test system for testing a CRT device is disclosed. The CRT test system comprises a connecting device, a power module, a control module, a first test module, and an illumination module. The connecting device detachably and electrically connects with the CRT device; the power module electrically connects with the connecting device; the control module electrically connects with the connecting device; and the control module comprises test program. After the CRT device receives a control signal transmitted from the test program, the CRT device generates a response signal and transmits the response signal to the first test module. When the first test module detects that the control signal and the response signal fit in with a first test signal status, the illumination module displays a first light sign; when the control signal and the response signal do not fit in with the first test signal status, the illumination module displays a second light sign.
Public/Granted literature
- US20100295949A1 CRT test system Public/Granted day:2010-11-25
Information query