Invention Grant
- Patent Title: Capacitor test method and circuit therefor
- Patent Title (中): 电容测试方法及电路
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Application No.: US12621951Application Date: 2009-11-19
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Publication No.: US08179156B2Publication Date: 2012-05-15
- Inventor: Pavel Horsky , Petr Kamenicky
- Applicant: Pavel Horsky , Petr Kamenicky
- Applicant Address: US AZ Phoenix
- Assignee: Semiconductor Components Industries, LLC
- Current Assignee: Semiconductor Components Industries, LLC
- Current Assignee Address: US AZ Phoenix
- Agent Robert F. Hightower
- Main IPC: G01R31/40
- IPC: G01R31/40

Abstract:
In one embodiment, a closed loop control system is caused to operate in an open loop configuration. At some time while operating in the open loop configuration the system detected the presence or absence of a.c. signals in an output signal of the system in order to detect the presence or absence of a failure of a control loop element, such as an output capacitor.
Public/Granted literature
- US20110115520A1 CAPACITOR TEST METHOD AND CIRCUIT THEREFOR Public/Granted day:2011-05-19
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