Invention Grant
- Patent Title: Method for detecting touch points of touch control device
- Patent Title (中): 触摸控制装置触摸点检测方法
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Application No.: US12314029Application Date: 2008-12-03
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Publication No.: US08179373B2Publication Date: 2012-05-15
- Inventor: Chen-Yu Liu , Chun-Chi Lin
- Applicant: Chen-Yu Liu , Chun-Chi Lin
- Applicant Address: TW Taipei
- Assignee: TPK Touch Solutions Inc.
- Current Assignee: TPK Touch Solutions Inc.
- Current Assignee Address: TW Taipei
- Agent Gokalp Bayramoglu; Anna Tsang
- Priority: TW97136447A 20080923
- Main IPC: G06F3/041
- IPC: G06F3/041

Abstract:
A method for detecting touch points of touch control device is disclosed. The touch control device comprises a first substrate having a first conductive layer and a second substrate having a second conductive layer. The first and second conductive layers are respectively connected to a control circuit which is coupled to a microcontroller. The control circuit performs driving on the first conductive layer to generate a gradient potential, and performs scanning on the second conductive layer to determine a first-axis coordinates. Then the control circuit drives the second conductive layer to generate a gradient potential, and performs scanning on the first conductive layer to determine the second-axis coordinates.
Public/Granted literature
- US20100073307A1 Method for detecting touch points of touch control device Public/Granted day:2010-03-25
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