Invention Grant
- Patent Title: Hard disk inspection apparatus
- Patent Title (中): 硬盘检测仪
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Application No.: US12545991Application Date: 2009-08-24
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Publication No.: US08179524B2Publication Date: 2012-05-15
- Inventor: Yoichi Hayashi , Shinichiro Okada
- Applicant: Yoichi Hayashi , Shinichiro Okada
- Applicant Address: JP Tokyo
- Assignee: Fujifilm Corporation
- Current Assignee: Fujifilm Corporation
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2008-222165 20080829
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/55 ; G01B11/24 ; G01B11/30

Abstract:
A hard disk inspection apparatus comprises a disk holding device which holds a hard disk; a light source which generates a light that illuminates an inspection region portion of a hard disk that is held by the disk holding device; a light guide which has a branched shape and guides a light from the light source to a plurality of light projecting parts; and an image pickup device which takes an image by receiving reflected light from the inspection region portion; wherein an illumination light is shone onto the inspection region from plural courses by shining the illumination light that is guided by the light guide onto the inspection region front the plurality of light projecting parts.
Public/Granted literature
- US20100053602A1 HARD DISK INSPECTION APPARATUS Public/Granted day:2010-03-04
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