Invention Grant
- Patent Title: X-ray CT apparatus and method thereof
- Patent Title (中): X射线CT装置及其方法
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Application No.: US12673197Application Date: 2008-08-07
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Publication No.: US08180016B2Publication Date: 2012-05-15
- Inventor: Ikuo Kanno
- Applicant: Ikuo Kanno
- Applicant Address: JP
- Assignee: Kyoto University
- Current Assignee: Kyoto University
- Current Assignee Address: JP
- Agent Gerald E. Hespos; Michael J. Porco
- Priority: JP2007-211948 20070815
- International Application: PCT/JP2008/064229 WO 20080807
- International Announcement: WO2009/022625 WO 20090219
- Main IPC: A61B6/03
- IPC: A61B6/03

Abstract:
In an X-ray CT apparatus 1 and an X-ray CT method, the thickness of an object to be inspected is computed on the basis of the number of transmitted X-rays in a specific energy range set above and below the K-absorption edge of an X-ray contrast medium serving as the object to be inspected, and a CT image is reconstructed on the basis of the computed thickness of the object to be inspected. Such X-ray CT apparatus 1 and X-ray CT method can generate an X-ray CT image stably and independently of the size of the object to be inspected and of X-ray tube voltage (X-ray energy distribution).
Public/Granted literature
- US20110194668A1 X-RAY CT APPARATUS AND METHOD THEREOF Public/Granted day:2011-08-11
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