Invention Grant
US08180016B2 X-ray CT apparatus and method thereof 有权
X射线CT装置及其方法

  • Patent Title: X-ray CT apparatus and method thereof
  • Patent Title (中): X射线CT装置及其方法
  • Application No.: US12673197
    Application Date: 2008-08-07
  • Publication No.: US08180016B2
    Publication Date: 2012-05-15
  • Inventor: Ikuo Kanno
  • Applicant: Ikuo Kanno
  • Applicant Address: JP
  • Assignee: Kyoto University
  • Current Assignee: Kyoto University
  • Current Assignee Address: JP
  • Agent Gerald E. Hespos; Michael J. Porco
  • Priority: JP2007-211948 20070815
  • International Application: PCT/JP2008/064229 WO 20080807
  • International Announcement: WO2009/022625 WO 20090219
  • Main IPC: A61B6/03
  • IPC: A61B6/03
X-ray CT apparatus and method thereof
Abstract:
In an X-ray CT apparatus 1 and an X-ray CT method, the thickness of an object to be inspected is computed on the basis of the number of transmitted X-rays in a specific energy range set above and below the K-absorption edge of an X-ray contrast medium serving as the object to be inspected, and a CT image is reconstructed on the basis of the computed thickness of the object to be inspected. Such X-ray CT apparatus 1 and X-ray CT method can generate an X-ray CT image stably and independently of the size of the object to be inspected and of X-ray tube voltage (X-ray energy distribution).
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