Invention Grant
- Patent Title: Method of detecting a defect on an object
- Patent Title (中): 检测物体上的缺陷的方法
-
Application No.: US12383017Application Date: 2009-03-19
-
Publication No.: US08184899B2Publication Date: 2012-05-22
- Inventor: Yu-Sin Yang , Kyung-Suk Song , Ji-Hae Kim , Chung-Sam Jun
- Applicant: Yu-Sin Yang , Kyung-Suk Song , Ji-Hae Kim , Chung-Sam Jun
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Onello & Mello, LLP
- Priority: KR10-2008-0025901 20080320
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
In a method of detecting a defect on an object, a preliminary reference image can be obtained from a plurality of comparison regions defined on the object. The preliminary reference image is divided into reference zones by a similar brightness. Each of the reference zones is provided with substantially the same gray level, respectively, to obtain a reference image. Whether a defect exists in an inspection region in the comparison regions is determined using the reference image. Thus, defects in the inspection regions having different brightnesses can be detected using the properly obtained reference image.
Public/Granted literature
- US20090238445A1 Method of detecting a defect on an object Public/Granted day:2009-09-24
Information query