Invention Grant
- Patent Title: Yield improvement for Josephson junction test device formation
- Patent Title (中): 约瑟夫逊结测试装置形成的产量提高
-
Application No.: US12502640Application Date: 2009-07-14
-
Publication No.: US08188752B2Publication Date: 2012-05-29
- Inventor: Mark B. Ketchen , Shwetank Kumar , Matthias Steffen , Christopher B. Lirakis , Richard Lazarus
- Applicant: Mark B. Ketchen , Shwetank Kumar , Matthias Steffen , Christopher B. Lirakis , Richard Lazarus
- Applicant Address: US NY Armonk US MA Cambridge
- Assignee: International Business Machines Corporation,Raytheon BBN Technologies Corp.
- Current Assignee: International Business Machines Corporation,Raytheon BBN Technologies Corp.
- Current Assignee Address: US NY Armonk US MA Cambridge
- Agency: Cantor Colburn LLP
- Agent Vazken Alexanian
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
An apparatus for measuring component performance including a feed line having an input port and an output port, a first resonator connected to the feed line, a first Josephson junction device connected to the first resonator and to ground, and a second resonator connected to the feed line and to ground.
Public/Granted literature
- US20110012619A1 Yield Improvement for Josephson Junction Test Device Formation Public/Granted day:2011-01-20
Information query
