Invention Grant
- Patent Title: Data readout circuit and semiconductor memory device
- Patent Title (中): 数据读出电路和半导体存储器件
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Application No.: US12503894Application Date: 2009-07-16
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Publication No.: US08189405B2Publication Date: 2012-05-29
- Inventor: Nobukazu Murata , Katsuaki Matsui
- Applicant: Nobukazu Murata , Katsuaki Matsui
- Applicant Address: JP Tokyo
- Assignee: OKI Semiconductor Co., Ltd.
- Current Assignee: OKI Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volentine & Whitt, PLLC
- Priority: JP2008-187721 20080718
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A data readout circuit including a 1st PMOS transistor operating in saturation and including a source connected to a power supply, a drain connected to an input terminal a memory cell, and a gate connected to a 1st bias voltage; a 2nd PMOS transistor including a source connected to the drain of the 1st PMOS transistor, a drain connected to an output terminal, and a gate connected to a 2nd bias voltage; a 1st NMOS transistor including a drain connected to the drain of the 2nd PMOS transistor, a source grounded, and a gate connected to a 3rd bias voltage; and a bias voltage section causing the 2nd PMOS transistor to operate in saturation, and supplying the 2nd bias voltage adjusted so as to keep a reference voltage of the input terminal at a junction point between the drain and the source of the 1st and 2nd PMOS transistors respectively.
Public/Granted literature
- US20100014362A1 DATA READOUT CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2010-01-21
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