Invention Grant
- Patent Title: Jitter measurement
- Patent Title (中): 抖动测量
-
Application No.: US13108151Application Date: 2011-05-16
-
Publication No.: US08189728B1Publication Date: 2012-05-29
- Inventor: Jingfeng Liu , Hongwei Song
- Applicant: Jingfeng Liu , Hongwei Song
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: H04L7/00
- IPC: H04L7/00 ; H04L25/00 ; H04L25/40

Abstract:
A specialized structure measures clock-to-data jitter in an optical memory interface by averaging the result of two second-order estimates of zero crossing using measured signal values on either side of the zero crossing. In one embodiment, a first estimate uses two sample points before the zero crossing and one sample point after while the second estimate uses one sample point before the zero crossing and sample two points after.
Information query