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US08189728B1 Jitter measurement 有权
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Jitter measurement
Abstract:
A specialized structure measures clock-to-data jitter in an optical memory interface by averaging the result of two second-order estimates of zero crossing using measured signal values on either side of the zero crossing. In one embodiment, a first estimate uses two sample points before the zero crossing and one sample point after while the second estimate uses one sample point before the zero crossing and sample two points after.
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