Invention Grant
US08193006B2 Method of chip repair by stacking a plurality of bad dies 有权
通过堆叠多个坏的模具来修复芯片的方法

Method of chip repair by stacking a plurality of bad dies
Abstract:
A method for repairing a chip with a stacked structure of chips is provided. First, a first chip is provided, which includes a first circuit block with a first function, a second circuit block with a second function, and a signal path electrically connected to the first and the second circuit blocks. A second chip is provided, which includes a third circuit block with the first function. The functions of the first and the second chips are verified. The first circuit block is disabled if the first circuit block is defective. The third circuit block is electrically connected to the signal path to replace the first circuit block and provide the first function if the second circuit block is functional and the third circuit block is functional.
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