Invention Grant
- Patent Title: Abnormality detection apparatus
- Patent Title (中): 异常检测装置
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Application No.: US12320178Application Date: 2009-01-21
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Publication No.: US08193782B2Publication Date: 2012-06-05
- Inventor: Hitoshi Mori , Toshinori Maruyama
- Applicant: Hitoshi Mori , Toshinori Maruyama
- Applicant Address: JP Kariya
- Assignee: Denso Corporation
- Current Assignee: Denso Corporation
- Current Assignee Address: JP Kariya
- Agency: Oliff & Berridge, PLC
- Priority: JP2008-037191 20080219
- Main IPC: H02K11/00
- IPC: H02K11/00 ; H02P9/00 ; H02H7/06

Abstract:
The abnormality detection apparatus includes a first function of measuring a first temperature of a first portion of the abnormality detection apparatus, the first temperature having a correlation with a second temperature of a second portion of a vehicle alternator, a second function of integrating a stress depending on a temperature variation of the first portion on the basis of the first temperature measured by the first function, a third function of predicting occurrence of abnormality in the second portion depending on the stress integrated by the second function, and a fourth function of issuing an alarm when the third function predicts occurrence of abnormality.
Public/Granted literature
- US20090206802A1 Abnormality detection apparatus Public/Granted day:2009-08-20
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