Invention Grant
- Patent Title: Sample analyzer
- Patent Title (中): 样品分析仪
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Application No.: US12462118Application Date: 2009-07-28
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Publication No.: US08194235B2Publication Date: 2012-06-05
- Inventor: Tokihiro Kosaka , Koichi Okubo
- Applicant: Tokihiro Kosaka , Koichi Okubo
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2008-200179 20080801
- Main IPC: G01N33/48
- IPC: G01N33/48 ; G01N21/01

Abstract:
The present invention is to present a sample analyzer, comprising: an imaging device for imaging a sample container which has translucency and contains a sample; a measuring device for aspirating the sample contained in the sample container and measuring the aspirated sample; a transporting device for transporting the sample container to a supply position for supplying the sample contained in the sample container to the measuring device; a sample volume obtainer for obtaining sample volume information relating to volume of the sample in the sample container, based on an image obtained by imaging the sample container by the imaging device; and a transport controller for controlling the transporting device to perform a transport operation in accordance with the sample volume information obtained by the sample volume obtainer.
Public/Granted literature
- US20100066996A1 Sample analyzer Public/Granted day:2010-03-18
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