Invention Grant
- Patent Title: Resistance change memory device
- Patent Title (中): 电阻变化记忆装置
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Application No.: US12605799Application Date: 2009-10-26
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Publication No.: US08194434B2Publication Date: 2012-06-05
- Inventor: Haruki Toda
- Applicant: Haruki Toda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maie & Neustadt, L.L.P.
- Priority: JP2009-203056 20090902
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A resistance change memory device including: a cell array with memory cells arranged therein, the memory cell storing a resistance state as data in a non-volatile manner; a write buffer configured to supply voltage and current to a selected memory cell in accordance with data to be written in it; and a write control circuit configured to make a part of current supplied to the selected memory cell flow out in accordance with the selected memory cell's state change in a write mode.
Public/Granted literature
- US20110051492A1 RESISTANCE CHANGE MEMORY DEVICE Public/Granted day:2011-03-03
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