Invention Grant
- Patent Title: Test apparatus for 64B/66B encoding process
- Patent Title (中): 用于64B / 66B编码过程的测试装置
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Application No.: US12710684Application Date: 2010-02-23
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Publication No.: US08194723B2Publication Date: 2012-06-05
- Inventor: Tomohiro Ito , Takayuki Awano
- Applicant: Tomohiro Ito , Takayuki Awano
- Applicant Address: JP Atsugi-shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-shi
- Agency: Greer, Burns & Crain, Ltd.
- Priority: JP2009-045596 20090227
- Main IPC: H04B3/46
- IPC: H04B3/46 ; G06F11/00

Abstract:
The present invention provides a test apparatus for a 64B/66B encoding process capable of precisely performing a test with a high reproducibility on a certain pattern of a 64B/66B encoder or decoder. A frame generator generates frame data in a layer higher than a physical coding sublayer of Ethernet (registered trademark) and inputs the frame data to a 64B/66B encoder such that the 64B/66B encoder performs a 64B/66B encoding process of the physical coding sublayer with respect to the frame data. A sequence pattern generator generates a certain 66B sequence pattern written in advance, and a controller writes a desired sequence pattern in the sequence pattern generator and, at the same time, controls a data selector to select one of data encoded by the 64B/66B encoder and a sequence pattern output from the sequence pattern generator and to provide the selected one to a test subject.
Public/Granted literature
- US20100220777A1 TEST APPARATUS FOR 64B/66B ENCODING PROCESS Public/Granted day:2010-09-02
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