Invention Grant
- Patent Title: X-ray inspection based on scatter detection
- Patent Title (中): 基于散射检测的X射线检查
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Application No.: US12891997Application Date: 2010-09-28
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Publication No.: US08194822B2Publication Date: 2012-06-05
- Inventor: Peter Rothschild , Jeffrey Schubert , Richard Schueller
- Applicant: Peter Rothschild , Jeffrey Schubert , Richard Schueller
- Applicant Address: US MA Billerica
- Assignee: American Science and Engineering, Inc.
- Current Assignee: American Science and Engineering, Inc.
- Current Assignee Address: US MA Billerica
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: G01N23/203
- IPC: G01N23/203

Abstract:
Systems and methods for inspecting an object with a scanned beam of penetrating radiation. Scattered radiation from the beam is detected, in either a backward or forward direction. Characteristic values of the scattered radiation are compared to expected reference values to characterize the object. Additionally, penetrating radiation transmitted through the inspected object may be combined with scatter information. In certain embodiments, the inspected field of view is less than 0.1 steradians, and the detector is separate from the source of penetrating radiation and is disposed, with respect to the object, such as to subtend greater than 0.5 steradians in the field of view of the object.
Public/Granted literature
- US20110075808A1 X-Ray Inspection Based on Scatter Detection Public/Granted day:2011-03-31
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