Invention Grant
- Patent Title: Monitoring physical parameters in an emulation environment
- Patent Title (中): 在仿真环境中监视物理参数
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Application No.: US12948468Application Date: 2010-11-17
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Publication No.: US08195446B2Publication Date: 2012-06-05
- Inventor: Eric Durand , Christophe Joubert , Christian Niquet , Virginie Voirin
- Applicant: Eric Durand , Christophe Joubert , Christian Niquet , Virginie Voirin
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agency: Klarquist Sparkman, LLP
- Main IPC: G06F9/455
- IPC: G06F9/455

Abstract:
A method and system is disclosed for monitoring and viewing physical parameters while the emulator is emulating a design. Additionally, the parameters are in real time or substantially real time, such as after a periodic update. In one embodiment, a monitoring portion of the emulator periodically monitors the emulator boards and power supplies for physical information. The physical information is communicated to a workstation for communication to a user. For example, the workstation can display the physical information in a graphical user interface (GUI) that shows which boards are plugged in the system and which slots are empty. In yet another aspect, the user can select a particular board in the system and view communication information, such as data errors, status, link errors, global errors, etc.
Public/Granted literature
- US20110119045A1 MONITORING PHYSICAL PARAMETERS IN AN EMULATION ENVIRONMENT Public/Granted day:2011-05-19
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