Invention Grant
- Patent Title: Merging sample based profiling data
- Patent Title (中): 合并基于样本的分析数据
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Application No.: US11649464Application Date: 2007-01-03
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Publication No.: US08196117B2Publication Date: 2012-06-05
- Inventor: David LaFrance-Linden
- Applicant: David LaFrance-Linden
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/45 ; G06F15/173 ; G06F11/00

Abstract:
In one embodiment, a computer system comprises one or more processors, and a memory module communicatively connected to the one or more processors. The memory module comprises logic instructions stored on a computer readable medium which, when executed on the one or more processors configure the one or more processors to normalize data from a first data set comprising sample based profiling data to form a first normalized data set, normalize data from a second data set comprising sample based profiling data to form a second normalized data set, combine the first normalized data set and the second normalized data set to form a merged data set, and present a portion of the merged data set on a user interface.
Public/Granted literature
- US20080162524A1 Merging sample based profiling data Public/Granted day:2008-07-03
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