Invention Grant
- Patent Title: Mounting test method
- Patent Title (中): 安装试验方法
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Application No.: US12534305Application Date: 2009-08-03
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Publication No.: US08199320B2Publication Date: 2012-06-12
- Inventor: Hideaki Takahashi
- Applicant: Hideaki Takahashi
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2008-225900 20080903
- Main IPC: G01N21/00
- IPC: G01N21/00
Abstract:
A method for testing a part mounting status on a substrate, the method comprises preparing the part including a retroreflection portion for occurring reflect light by retroreflection; irradiating light onto the retroreflection portion; receiving the reflect light from the retroreflection portion; and determining whether the part exist by the use of the reflect light from the retroreflection portion.
Public/Granted literature
- US20100053626A1 MOUNTING TEST METHOD Public/Granted day:2010-03-04
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