Invention Grant
- Patent Title: Automated yield monitoring and control
- Patent Title (中): 自动产量监测和控制
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Application No.: US11810506Application Date: 2007-06-05
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Publication No.: US08206123B2Publication Date: 2012-06-26
- Inventor: Dennis M. Hilton , Karl Taub , Keith Lipford , Philip A Zanghi
- Applicant: Dennis M. Hilton , Karl Taub , Keith Lipford , Philip A Zanghi
- Applicant Address: US MD Columbia
- Assignee: W. R. Grace & Co.-Conn.
- Current Assignee: W. R. Grace & Co.-Conn.
- Current Assignee Address: US MD Columbia
- Agency: Woodcock Washburn LLP
- Main IPC: B05C11/10
- IPC: B05C11/10

Abstract:
A system is adapted to automatically maintain a desired yield level for a slurry flow. Measurements of the electrical conductivity of a slurry are taken and corrected for the effects of temperature and pressure. The corrected conductivity measurements are used to arrive at a value for system yield. The system automatically determines if the yield is too high or too low relative to a desired level, and controls the rate at which accelerator is added to the slurry in order to increase or decrease yield.
Public/Granted literature
- US20080305554A1 Automated yield monitoring and control Public/Granted day:2008-12-11
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