Invention Grant
- Patent Title: Methods of selectively depositing an epitaxial layer
- Patent Title (中): 选择性沉积外延层的方法
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Application No.: US12849387Application Date: 2010-08-03
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Publication No.: US08207023B2Publication Date: 2012-06-26
- Inventor: Zhiyuan Ye , Saurabh Chopra , Yihwan Kim
- Applicant: Zhiyuan Ye , Saurabh Chopra , Yihwan Kim
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Moser Taboada
- Agent Alan Taboada
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/84 ; H01L21/7127 ; H01L21/336 ; H01L21/20 ; H01L21/36 ; H01L21/31

Abstract:
Methods for selectively depositing an epitaxial layer are provided herein. In some embodiments, providing a substrate having a monocrystalline first surface and a non-monocrystalline second surface; exposing the substrate to a deposition gas to deposit a layer on the first and second surfaces, the layer comprising a first portion deposited on the first surfaces and a second portion deposited on the second surfaces; and exposing the substrate to an etching gas comprising a first gas comprising hydrogen and a halogen and a second gas comprising at least one of a Group III, IV, or V element to selectively etch the first portion of the layer at a slower rate than the second portion of the layer. In some embodiments, the etching gas comprises hydrogen chloride (HCl) and germane (GeH4).
Public/Granted literature
- US20110124169A1 METHODS OF SELECTIVELY DEPOSITING AN EPITAXIAL LAYER Public/Granted day:2011-05-26
Information query
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