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US08207065B2 Method for forming a shallow trench isolation 有权
形成浅沟槽隔离的方法

Method for forming a shallow trench isolation
Abstract:
A method for forming a shallow trench isolation includes providing a substrate with a trench, a first liner layer and a second liner layer sequentially in the trench with a first oxide filling the trench, performing a first wet etching to remove part of the first oxide and part of the first liner layer to expose the substrate, performing a second wet etching to remove part of the second liner layer so that the second liner layer is lower than surface of the substrate, performing a third wet etching to remove part of the first oxide and part of the first liner layer, and filling the trench with a second oxide to form a shallow trench isolation.
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