Invention Grant
- Patent Title: Charged particle beam apparatus
- Patent Title (中): 带电粒子束装置
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Application No.: US12615955Application Date: 2009-11-10
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Publication No.: US08207513B2Publication Date: 2012-06-26
- Inventor: Yuko Sasaki , Yasuhiro Gunji , Zhaohui Cheng
- Applicant: Yuko Sasaki , Yasuhiro Gunji , Zhaohui Cheng
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2004-367153 20041220
- Main IPC: G21K5/10
- IPC: G21K5/10

Abstract:
A charged particle beam apparatus is provided which has high resolving power and a wide scanning region (observation field of view). The apparatus has a unit for adjusting the focus, a unit for adjusting astigmatism, a unit for controlling and detecting scanning positions and a controller operative to control the focus adjustment and astigmatism adjustment at a time in interlocked relation to the scanning positions, thereby assuring compatibility between the high resolving power and the observation view field of a wide area.
Public/Granted literature
- US20100051806A1 CHARGED PARTICLE BEAM APPARATUS Public/Granted day:2010-03-04
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