Invention Grant
- Patent Title: Cross-point memory structures
- Patent Title (中): 交叉点记忆结构
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Application No.: US13213718Application Date: 2011-08-19
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Publication No.: US08207557B2Publication Date: 2012-06-26
- Inventor: Scott Sills , Gurtej S. Sandhu
- Applicant: Scott Sills , Gurtej S. Sandhu
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: H01L23/52
- IPC: H01L23/52 ; H01L21/82

Abstract:
Some embodiments include cross-point memory structures. The structures may include a line of first electrode material extending along a first horizontal direction, a multi-sided container of access device materials over the first electrode material, a memory element material within the multi-sided container, and a line of second electrode material over the memory element material and extending along a second horizontal direction that is orthogonal to the first horizontal direction. Some embodiments include methods of forming memory arrays. The methods may include forming a memory cell stack over a first electrode material, and then patterning the first electrode material and the memory cell stack into a first set of spaced lines extending along a first horizontal direction. Spaced lines of second electrode material may be formed over the first set of spaced lines, and may extend along a second horizontal direction that is orthogonal to the first horizontal direction.
Public/Granted literature
- US20110298014A1 Cross-Point Memory Structures Public/Granted day:2011-12-08
Information query
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