Invention Grant
- Patent Title: Signal generation apparatus and test apparatus
- Patent Title (中): 信号发生装置和测试装置
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Application No.: US12505826Application Date: 2009-07-20
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Publication No.: US08207765B2Publication Date: 2012-06-26
- Inventor: Go Utamaru
- Applicant: Go Utamaru
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
Provided is a signal generating apparatus that generates an output signal having a designated phase, comprising a phase difference detecting section that outputs a control signal corresponding to a phase difference between a reference signal having a prescribed period and the output signal; an oscillating section that generates a periodic signal having a frequency corresponding to the control signal; and a phase shifting section that outputs the output signal to have a phase that is shifted from the phase of the periodic signal by a designated phase amount.
Public/Granted literature
- US20110012659A1 SIGNAL GENERATION APPARATUS AND TEST APPARATUS Public/Granted day:2011-01-20
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