Invention Grant
US08207772B2 Duty detection circuit and duty cycle correction circuit including the same
失效
占空比检测电路和占空比校正电路包括相同
- Patent Title: Duty detection circuit and duty cycle correction circuit including the same
- Patent Title (中): 占空比检测电路和占空比校正电路包括相同
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Application No.: US12832092Application Date: 2010-07-08
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Publication No.: US08207772B2Publication Date: 2012-06-26
- Inventor: Dong-Suk Shin
- Applicant: Dong-Suk Shin
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2010-0050800 20100531
- Main IPC: H03K3/017
- IPC: H03K3/017

Abstract:
A duty cycle correction circuit includes a duty adjustment circuit configured to generate an output clock by adjusting a duty cycle of an input clock in response to a duty adjustment code, a duty detection circuit configured to measure a difference between a width of a high pulse and a width of a low pulse of the output clock at each update period, and generate a duty detection code corresponding to the measured value, an accumulation circuit configured to generate the duty adjustment code by accumulating a value of the duty detection code outputted at each update period, and a toggling number adjustment circuit configured to adjust a toggling number of the output clock, which adjustment determines the update period, according to a frequency of the output clock.
Public/Granted literature
- US20110291725A1 DUTY DETECTION CIRCUIT AND DUTY CYCLE CORRECTION CIRCUIT INCLUDING THE SAME Public/Granted day:2011-12-01
Information query
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