Invention Grant
US08207772B2 Duty detection circuit and duty cycle correction circuit including the same 失效
占空比检测电路和占空比校正电路包括相同

  • Patent Title: Duty detection circuit and duty cycle correction circuit including the same
  • Patent Title (中): 占空比检测电路和占空比校正电路包括相同
  • Application No.: US12832092
    Application Date: 2010-07-08
  • Publication No.: US08207772B2
    Publication Date: 2012-06-26
  • Inventor: Dong-Suk Shin
  • Applicant: Dong-Suk Shin
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2010-0050800 20100531
  • Main IPC: H03K3/017
  • IPC: H03K3/017
Duty detection circuit and duty cycle correction circuit including the same
Abstract:
A duty cycle correction circuit includes a duty adjustment circuit configured to generate an output clock by adjusting a duty cycle of an input clock in response to a duty adjustment code, a duty detection circuit configured to measure a difference between a width of a high pulse and a width of a low pulse of the output clock at each update period, and generate a duty detection code corresponding to the measured value, an accumulation circuit configured to generate the duty adjustment code by accumulating a value of the duty detection code outputted at each update period, and a toggling number adjustment circuit configured to adjust a toggling number of the output clock, which adjustment determines the update period, according to a frequency of the output clock.
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