Invention Grant
- Patent Title: Charge pump circuit with improved reliability
- Patent Title (中): 电荷泵电路具有提高的可靠性
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Application No.: US12940048Application Date: 2010-11-05
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Publication No.: US08207785B2Publication Date: 2012-06-26
- Inventor: Wei Wang
- Applicant: Wei Wang
- Applicant Address: TW Xindian Dist., New Taipei
- Assignee: Princeton Technology Corporation
- Current Assignee: Princeton Technology Corporation
- Current Assignee Address: TW Xindian Dist., New Taipei
- Agent Winston Hsu; Scott Margo
- Priority: TW99200575U 20100112
- Main IPC: G05F3/02
- IPC: G05F3/02

Abstract:
A charge pump circuit, including a charging capacitor, a pumping capacitor, a switch, two voltage-limiting devices, and two path-control devices, generates an output voltage by amplifying an input voltage. The charging capacitor is charged by the input voltage and discharged according to the voltage level of a node. The pumping capacitor can provide the output voltage by storing the charges transmitted from the charging capacitor. The switch controls the signal transmission path between the node and a ground terminal according to a clock signal. The first path-control device controls the signal transmission path between the input signal and the charging capacitor. The second path-control device controls the signal transmission path between the charging capacitor and the pumping capacitor.
Public/Granted literature
- US20110169559A1 CHARGE PUMP CIRCUIT WITH IMPROVED RELIABILITY Public/Granted day:2011-07-14
Information query
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