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US08207785B2 Charge pump circuit with improved reliability 失效
电荷泵电路具有提高的可靠性

  • Patent Title: Charge pump circuit with improved reliability
  • Patent Title (中): 电荷泵电路具有提高的可靠性
  • Application No.: US12940048
    Application Date: 2010-11-05
  • Publication No.: US08207785B2
    Publication Date: 2012-06-26
  • Inventor: Wei Wang
  • Applicant: Wei Wang
  • Applicant Address: TW Xindian Dist., New Taipei
  • Assignee: Princeton Technology Corporation
  • Current Assignee: Princeton Technology Corporation
  • Current Assignee Address: TW Xindian Dist., New Taipei
  • Agent Winston Hsu; Scott Margo
  • Priority: TW99200575U 20100112
  • Main IPC: G05F3/02
  • IPC: G05F3/02
Charge pump circuit with improved reliability
Abstract:
A charge pump circuit, including a charging capacitor, a pumping capacitor, a switch, two voltage-limiting devices, and two path-control devices, generates an output voltage by amplifying an input voltage. The charging capacitor is charged by the input voltage and discharged according to the voltage level of a node. The pumping capacitor can provide the output voltage by storing the charges transmitted from the charging capacitor. The switch controls the signal transmission path between the node and a ground terminal according to a clock signal. The first path-control device controls the signal transmission path between the input signal and the charging capacitor. The second path-control device controls the signal transmission path between the charging capacitor and the pumping capacitor.
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