Invention Grant
- Patent Title: Focus detection apparatus, microscope
- Patent Title (中): 聚焦检测仪,显微镜
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Application No.: US12500202Application Date: 2009-07-09
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Publication No.: US08208202B2Publication Date: 2012-06-26
- Inventor: Ichiro Sase
- Applicant: Ichiro Sase
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2007-010541 20070119
- Main IPC: G02B21/00
- IPC: G02B21/00

Abstract:
A focus detection apparatus is provided with a light source 16 that emanates light with a given wavelength range; a reflection member 15 that reflects light emanated from the light source 16 to lead to an object 6a, reflects light from the light source 16 reflected from the object 6a, and transmits light from the object 6a with at least two different wavelength ranges except the light reflected from the object 6a; a photodetector 21 detecting the light from the light source 16 reflected from the object 6a; and a controller 22 detecting a focus shift between the objective lens 8 and the object 6a in the microscope 2 based on a signal detected by the photodetector 21, thereby providing a focus detection apparatus capable of limiting wavelength range of light for focus detection thereby able to use wider wavelength range for the microscope observation, and a microscope equipped therewith.
Public/Granted literature
- US20090273830A1 FOCUS DETECTION APPARATUS, MICROSCOPE Public/Granted day:2009-11-05
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