Invention Grant
- Patent Title: SRAM yield enhancement by read margin improvement
- Patent Title (中): 通过读取余量提高SRAM产量提高
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Application No.: US12194142Application Date: 2008-08-19
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Publication No.: US08208316B2Publication Date: 2012-06-26
- Inventor: Nan Chen , Chang Jung , Zhiqin Chen
- Applicant: Nan Chen , Chang Jung , Zhiqin Chen
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Michelle Gallardo; Nicholas J. Pauley; Jonathan T. Velasco
- Main IPC: G11C7/06
- IPC: G11C7/06

Abstract:
A sense margin is improved for a read path in a memory array. Embodiments improve the sense margin by using gates with a lower threshold voltage in a read column multiplexer. A cross coupled keeper can further improve the sense margin by increasing a voltage level on a bit line storing a high value, thereby counteracting leakage on the “high” bit line.
Public/Granted literature
- US20100046280A1 SRAM Yield Enhancement by Read Margin Improvement Public/Granted day:2010-02-25
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