Invention Grant
US08208340B2 Latency counter, semiconductor memory device including the same, and data processing system
有权
延迟计数器,包括其的半导体存储器件和数据处理系统
- Patent Title: Latency counter, semiconductor memory device including the same, and data processing system
- Patent Title (中): 延迟计数器,包括其的半导体存储器件和数据处理系统
-
Application No.: US12876703Application Date: 2010-09-07
-
Publication No.: US08208340B2Publication Date: 2012-06-26
- Inventor: Hiroki Fujisawa
- Applicant: Hiroki Fujisawa
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-207002 20090908
- Main IPC: G11C8/00
- IPC: G11C8/00

Abstract:
A latency counter includes an input selecting circuit that selects one of a plurality of signal paths and supplies an internal command to the selected signal path, a shift circuit that switches a correspondence relation between the signal paths and a latch circuit, and an output selecting circuit that causes the internal command taken in the latch circuit to be output. The input selection circuit includes a timing control circuit allocated to each of the signal paths. The timing control circuit includes an SR latch circuit that is set by the internal command and is reset in response to deactivation of a corresponding count value. Therefore, it becomes possible to suppress shortening of an active period of the internal command that is output from the input selecting circuit.
Public/Granted literature
- US20110058445A1 LATENCY COUNTER, SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME, AND DATA PROCESSING SYSTEM Public/Granted day:2011-03-10
Information query