Invention Grant
- Patent Title: Method of predicting crop yield loss due to N-deficiency
- Patent Title (中): 预测由于N缺乏导致的作物产量损失的方法
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Application No.: US11936564Application Date: 2007-11-07
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Publication No.: US08208680B2Publication Date: 2012-06-26
- Inventor: Peter Clifton Scharf , Victoria Cacnio Hubbard
- Applicant: Peter Clifton Scharf , Victoria Cacnio Hubbard
- Applicant Address: US MO Columbia
- Assignee: The Curators of the University of Missouri
- Current Assignee: The Curators of the University of Missouri
- Current Assignee Address: US MO Columbia
- Agency: Polsinelli Shughart PC
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method for determining the yield loss of a crop using remote sensor data is described. The yield loss is determined using the reflectivity of green light by the crop canopy measured from remote sensor data such as an aerial photograph that is digitized and spatially referenced to the field's longitude and latitude. Green pixel values from the aerial photograph, expressed relative to green pixel values from well-fertilized areas of the field, are transformed to yield losses using a linear transformation that was developed using empirical data. A similar method is described to determine recommended nitrogen fertilization rates for the crop fields. The yield loss data is useful for nitrogen fertilization management, as it allows a producer of crops to weigh the expense of fertilization against the loss of revenue due to yield loss.
Public/Granted literature
- US20080304711A1 METHOD OF PREDICTING CROP YIELD LOSS DUE TO N-DEFICIENCY Public/Granted day:2008-12-11
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