Invention Grant
- Patent Title: Method for deriving parameter for three-dimensional measurement processing and three-dimensional visual sensor
- Patent Title (中): 用于导出三维测量处理参数和三维视觉传感器的方法
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Application No.: US12711179Application Date: 2010-02-23
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Publication No.: US08208718B2Publication Date: 2012-06-26
- Inventor: Shiro Fujieda , Atsushi Taneno , Hiroshi Yano , Yasuyuki Ikeda
- Applicant: Shiro Fujieda , Atsushi Taneno , Hiroshi Yano , Yasuyuki Ikeda
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Foley & Lardner LLP
- Priority: JPP2009-059922 20090312
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
In the present invention, processing for setting a parameter expressing a measurement condition of three-dimensional measurement to a value necessary to output a proper recognition result is easily performed. The three-dimensional measurement is performed to stereo images of real models WM1 and WM2 of a workpiece using a measurement parameter set by a user, and positions and attitudes of the workpiece models WM1 and WM2 are recognized based on the measurement result. An image expressing the recognition result is displayed, and numerical data indicating the selected recognition result is set to sample data in response to a user manipulation for selecting the recognition result. A setting value of the measurement parameter is changed every time in a predetermined numerical range, the three-dimensional measurement and recognition processing are performed using the setting measurement parameter, and a numerical range of the setting parameter is set to an acceptable range when the recognition result in which an amount of difference with sample data falls within a predetermined value is obtained. An intermediate value of the acceptable range is fixed and registered as an optimum value of the parameter.
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