Invention Grant
- Patent Title: Recognition system, recognition method, and recognition program
- Patent Title (中): 识别系统,识别方法和识别程序
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Application No.: US12092025Application Date: 2007-05-15
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Publication No.: US08208757B2Publication Date: 2012-06-26
- Inventor: Kazuyuki Sakurai
- Applicant: Kazuyuki Sakurai
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Dickstein Shapiro LLP
- Priority: JP2006-145274 20060525
- International Application: PCT/JP2007/060315 WO 20070515
- International Announcement: WO2007/138898 WO 20071206
- Main IPC: G06K9/62
- IPC: G06K9/62

Abstract:
A recognition system of this invention has feature point detection means (120), Hough transform means (130), and specific pattern output means (140). In the Hough transform means (130), a Hough space is designed so that a magnitude relation of a distance between points in the Hough space is equivalent to a predetermined magnitude relation of an inter-specific-pattern distance indicative of a difference between specific patterns. The recognition system detects the specific patterns using the Hough space. By adopting such a structure to express more similar specific patterns in an image as closer points also in the Hough space, it is possible to achieve an object of this invention.
Public/Granted literature
- US20090252420A1 RECOGNITION SYSTEM, RECOGNITION METHOD, AND RECOGNITION PROGRAM Public/Granted day:2009-10-08
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