Invention Grant
- Patent Title: Pattern identification method, apparatus, and program
- Patent Title (中): 模式识别方法,装置和程序
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Application No.: US10530275Application Date: 2004-12-16
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Publication No.: US08209172B2Publication Date: 2012-06-26
- Inventor: Yusuke Mitarai , Masakazu Matsuga , Katsuhiko Mori
- Applicant: Yusuke Mitarai , Masakazu Matsuga , Katsuhiko Mori
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2003-417973 20031216
- International Application: PCT/JP2004/019277 WO 20041216
- International Announcement: WO2005/059811 WO 20050630
- Main IPC: G10L15/00
- IPC: G10L15/00

Abstract:
Pattern recognition capable of robust identification for the variance of an input pattern is performed with a low processing cost while the possibility of identification errors is decreased. In a pattern recognition apparatus which identifies the pattern of input data from a data input unit (11) by using a hierarchical feature extraction processor (12) which hierarchically extracts features, an extraction result distribution analyzer (13) analyzes a distribution of at least one feature extraction result obtained by a primary feature extraction processor (121). On the basis of the analytical result, a secondary feature extraction processor (122) performs predetermined secondary feature extraction.
Public/Granted literature
- US20060074653A1 Pattern identification method, apparatus, and program Public/Granted day:2006-04-06
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