Invention Grant
US08209571B2 Valid-transmission verifying circuit and a semiconductor device including the same
有权
有效传输验证电路和包括该有效传输验证电路的半导体器件
- Patent Title: Valid-transmission verifying circuit and a semiconductor device including the same
- Patent Title (中): 有效传输验证电路和包括该有效传输验证电路的半导体器件
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Application No.: US11493438Application Date: 2006-07-26
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Publication No.: US08209571B2Publication Date: 2012-06-26
- Inventor: Chang-Hwan Lee
- Applicant: Chang-Hwan Lee
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2005-0067727 20050726
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G11C29/00 ; G06F11/00

Abstract:
A valid-transmission verifying circuit and a semiconductor device including the same are provided. The valid-transmission verifying circuit provides data to an output circuit in correspondence with reference data, the valid-transmission verifying circuit comprising: a data receiving terminal receiving the reference data; a valid-transmission verifier including a reference load unit configured to sample the reference data, the data sampling operation is interrupted in response to a sampling control signal to determine whether the data sampling operation has been performed within a sampling time; and a selection switch providing the reference data to one of the normal output circuit and the valid-transmission verifier in response to a mode selection signal.
Public/Granted literature
- US20070028154A1 Valid-transmission verifying circuit and a semiconductor device including the same Public/Granted day:2007-02-01
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