Invention Grant
- Patent Title: Verifying multiple constraints for circuit designs
- Patent Title (中): 验证电路设计的多个约束
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Application No.: US12553965Application Date: 2009-09-03
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Publication No.: US08209648B1Publication Date: 2012-06-26
- Inventor: Shan-Chyun Ku , Marcelo Glusman , Yee-Wing Hsieh , Manish Pandey , Angela Krstic , Sarath Kirihennedige
- Applicant: Shan-Chyun Ku , Marcelo Glusman , Yee-Wing Hsieh , Manish Pandey , Angela Krstic , Sarath Kirihennedige
- Applicant Address: US CA San Jose
- Assignee: Cadence Design Systems, Inc.
- Current Assignee: Cadence Design Systems, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F9/455

Abstract:
Certain embodiments of the present invention enable comparisons between constrained circuit designs by generating timing graphs for circuit designs, mapping timing constraints to the timing graphs, and comparing the mapped timing constraints from different timing graphs. Typically this comparison is made by identifying corresponding nodes in two or more timing graphs. Specific embodiments are also directed to multiple SDC (Synopsis Design Constraint) constraint specifications for a circuit and multiple constraint sets for different operational modes of a circuit.
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