Invention Grant
- Patent Title: Semiconductor manufacturing method of die pick-up from wafer
- Patent Title (中): 半导体晶片制取方法
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Application No.: US12836445Application Date: 2010-07-14
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Publication No.: US08211261B2Publication Date: 2012-07-03
- Inventor: Hiroshi Maki , Kazuhiro Seiki , Eiji Wada
- Applicant: Hiroshi Maki , Kazuhiro Seiki , Eiji Wada
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2005-013690 20050121
- Main IPC: B29C65/00
- IPC: B29C65/00 ; B32B37/00 ; B32B38/04

Abstract:
A manufacturing method of a semiconductor device comprising the steps of: affixing a die attach film and a dicing film to a back surface of a semiconductor wafer: thereafter dicing the semiconductor wafer and the die attach film to divide the semiconductor wafer into a plurality of semiconductor chips: thereafter pulling the dicing film from the center toward the outer periphery of the dicing film with a first tensile force to cut the die attach film chip by chip; and thereafter picking up the semiconductor chips together with the die attach film while pulling the dicing film from the center toward the outer periphery of the dicing film with a second tensile force smaller than the first tensile force.
Public/Granted literature
- US20100279465A1 SEMICONDUCTOR MANUFACTURING METHOD OF DIE PICK-UP FROM WAFER Public/Granted day:2010-11-04
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