Invention Grant
US08211624B2 Method for pattern formation and resin composition for use in the method
有权
用于图案形成的方法和用于该方法的树脂组合物
- Patent Title: Method for pattern formation and resin composition for use in the method
- Patent Title (中): 用于图案形成的方法和用于该方法的树脂组合物
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Application No.: US12601011Application Date: 2008-05-21
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Publication No.: US08211624B2Publication Date: 2012-07-03
- Inventor: Atsushi Nakamura , Tsutomu Shimokawa , Junichi Takahashi , Takayoshi Abe , Tomoki Nagai , Tomohiro Kakizawa
- Applicant: Atsushi Nakamura , Tsutomu Shimokawa , Junichi Takahashi , Takayoshi Abe , Tomoki Nagai , Tomohiro Kakizawa
- Applicant Address: JP Tokyo
- Assignee: JSR Corporation
- Current Assignee: JSR Corporation
- Current Assignee Address: JP Tokyo
- Agency: Ditthavong Mori & Steiner, P.C.
- Priority: JP2007-136669 20070523; JP2007-246847 20070925
- International Application: PCT/JP2008/059386 WO 20080521
- International Announcement: WO2008/143301 WO 20081127
- Main IPC: G03F7/00
- IPC: G03F7/00 ; G03F7/004 ; G03F7/20 ; G03F7/26 ; G03F7/40

Abstract:
A pattern forming method includes (1) selectively exposing a first resist layer, and developing the exposed first resist layer to form a first pattern, (2) applying a resin composition containing a hydroxyl group-containing resin and a solvent to the first pattern, baking the applied resin composition, and developing the baked resin composition to form a second pattern, the hydroxyl group-containing resin becoming insoluble or scarcely soluble in a developer when baked, and (3) totally or selectively exposing the second pattern to make the second pattern partly soluble in the developer, and developing the exposed second pattern to form a third pattern in which at least a hole or a groove is formed in the second pattern.
Public/Granted literature
- US20100190104A1 METHOD FOR PATTERN FORMATION AND RESIN COMPOSITION FOR USE IN THE METHOD Public/Granted day:2010-07-29
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