Invention Grant
- Patent Title: TOF mass spectrometer for stigmatic imaging and associated method
- Patent Title (中): TOF质谱仪用于眩晕成像及相关方法
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Application No.: US13054295Application Date: 2009-07-16
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Publication No.: US08212209B2Publication Date: 2012-07-03
- Inventor: Andrew Bowdler
- Applicant: Andrew Bowdler
- Applicant Address: GB Manchester
- Assignee: Kratos Analytical Limited
- Current Assignee: Kratos Analytical Limited
- Current Assignee Address: GB Manchester
- Agency: Squire Sanders (US) LLP
- Priority: GB0813135.1 20080717
- International Application: PCT/GB2009/001758 WO 20090716
- International Announcement: WO2010/007373 WO 20100121
- Main IPC: H01J49/40
- IPC: H01J49/40 ; B01D59/44

Abstract:
The present invention is concerned with improving the focusing of ions having a particular mass to charge ratio by optimising the electric field for the focusing of ions having that particular mass to charge ratio. In particular, the stigmatic focusing of ions can be improved by adjusting a voltage applied to an ion-optical lens 50 for ions of different mass to charge ratios as those ions pass through the lens. In one embodiment, a digital to analogue converter 32 and amplifier 34 are AC coupled to a high voltage DC power supply unit 38 by high voltage capacitor 36. The digital to analogue converter 32 generates a low voltage wave form which is amplified by the amplifier 34 and then added to the output of the high voltage supply 38 so that the desired voltage waveform is generated and applied to ion-optical lens 50 as ions pass through the lens.
Public/Granted literature
- US20110139973A1 TOF MASS SPECTROMETER FOR STIGMATIC IMAGING AND ASSOCIATED METHOD Public/Granted day:2011-06-16
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