Invention Grant
US08212216B2 In-line process measurement systems and methods 有权
在线过程测量系统和方法

In-line process measurement systems and methods
Abstract:
A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.
Public/Granted literature
Information query
Patent Agency Ranking
0/0