Invention Grant
- Patent Title: Particle beam irradiation apparatus
- Patent Title (中): 粒子束照射装置
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Application No.: US12991231Application Date: 2009-06-09
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Publication No.: US08212223B2Publication Date: 2012-07-03
- Inventor: Takaaki Iwata
- Applicant: Takaaki Iwata
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- International Application: PCT/JP2009/060531 WO 20090609
- International Announcement: WO2010/143267 WO 20101216
- Main IPC: G21K5/04
- IPC: G21K5/04

Abstract:
There is obtained a particle beam irradiation apparatus which does not use any IF sentence (conditional expression for case classification) and can calculate a control command and enhance irradiation position precision. The particle beam irradiation apparatus is provided with inverse mapping means having an inverse mapping mathematical expression model for generating an command value for the scanning electromagnet from a desired irradiation position coordinate of the charged particle beam in an irradiation subject so that irradiation to the irradiation subject is implemented on the basis of the command value concerned, and the scanning electromagnet is controlled on the basis of the command value generated from the desired irradiation position coordinate of the charged particle beam in the irradiation subject by using the inverse mapping mathematical expression model, thereby irradiating the irradiation subject with the charged particle beam while scanning the charged particle beam.
Public/Granted literature
- US20110163243A1 PARTICLE BEAM IRRADIATION APPARATUS Public/Granted day:2011-07-07
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