Invention Grant
US08212268B2 Epitaxial wafer, light-emitting element, method of fabricating epitaxial wafer and method of fabricating light-emitting element 有权
外延晶片,发光元件,外延晶片的制造方法和制造发光元件的方法

  • Patent Title: Epitaxial wafer, light-emitting element, method of fabricating epitaxial wafer and method of fabricating light-emitting element
  • Patent Title (中): 外延晶片,发光元件,外延晶片的制造方法和制造发光元件的方法
  • Application No.: US12692754
    Application Date: 2010-01-25
  • Publication No.: US08212268B2
    Publication Date: 2012-07-03
  • Inventor: Taichiroo Konno
  • Applicant: Taichiroo Konno
  • Applicant Address: JP Tokyo
  • Assignee: Hitachi Cable, Ltd.
  • Current Assignee: Hitachi Cable, Ltd.
  • Current Assignee Address: JP Tokyo
  • Agency: Foley & Lardner LLP
  • Priority: JP2009-204289 20090904
  • Main IPC: H01L33/00
  • IPC: H01L33/00
Epitaxial wafer, light-emitting element, method of fabricating epitaxial wafer and method of fabricating light-emitting element
Abstract:
An epitaxial wafer, a light-emitting element, a method of fabricating the epitaxial wafer and a method of fabricating the light-emitting element, which have a high output and a low forward voltage, and can be fabricated without increasing fabricating cost, are provided. The epitaxial wafer is formed with a light-emitting portion, a reflective portion provided between a semiconductor substrate and the light-emitting portion and a current dispersing layer having first and second current dispersing layers, wherein the reflective portion has plural pairs of layers having first and second semiconductor layers wherein the first semiconductor layer has a thickness of TA defined by Equation (1), T A = λ p 4 ⁢ n A ⁢ 1 - ( n I ⁢ n ⁢ sin ⁢ ⁢ θ n A ) 2 ( 1 ) the second semiconductor layer has a thickness of TB defined by Equation (2), T B = λ p 4 ⁢ n B ⁢ 1 - ( n I ⁢ n ⁢ sin ⁢ ⁢ θ n B ) 2 ( 2 ) and the second current dispersing layer has a high carrier density or a high impurity density and is provided with the convexoconcave portion on the surface.
Information query
Patent Agency Ranking
0/0