Invention Grant
- Patent Title: Radiation detector
- Patent Title (中): 辐射检测器
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Application No.: US10593792Application Date: 2005-03-10
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Publication No.: US08212285B2Publication Date: 2012-07-03
- Inventor: Arndt Jaeger , Peter Stauβ , Reiner Windisch
- Applicant: Arndt Jaeger , Peter Stauβ , Reiner Windisch
- Applicant Address: DE Regensburg
- Assignee: Osram Opto Semiconductors GmbH
- Current Assignee: Osram Opto Semiconductors GmbH
- Current Assignee Address: DE Regensburg
- Agency: Fish & Richardson P.C.
- Priority: DE102004015931 20040331; DE102004037020 20040730; DE102004053317 20041104
- International Application: PCT/DE2005/000428 WO 20050310
- International Announcement: WO2005/096394 WO 20051013
- Main IPC: H01L31/102
- IPC: H01L31/102

Abstract:
The invention specifies a radiation detector for detecting radiation (8) according to a predefined spectral sensitivity distribution (9) that exhibits a maximum at a predefined wavelength λ0, comprising a semiconductor body (1) with an active region (5) serving to generate a detector signal and intended to receive radiation, in which according to one embodiment the active region (5) includes a plurality of functional layers (4a, 4b, 4c, 4d) that have different band gaps and/or thicknesses and are implemented such that they (4a, 4b, 4c, 4d) at least partially absorb radiation in a range of wavelengths greater than λ0. According to a further embodiment, disposed after the active region is a filter layer structure (70) comprising at least one filter layer (7, 7a, 7b, 7c), said filter layer structure determining the short-wave side (101) of the detector sensitivity (10) according to the predefined spectral sensitivity distribution (9) by absorbing wavelengths smaller than λ0. A radiation detector for detecting radiation (8) according to the spectral sensitivity distribution (9) of the human eye is also specified. The semiconductor body can be monolithically integrated.
Public/Granted literature
- US20080237633A1 Radiation Detector Public/Granted day:2008-10-02
Information query
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