Invention Grant
- Patent Title: Method for deleting data from NAND type nonvolatile memory
- Patent Title (中): 从NAND型非易失性存储器中删除数据的方法
-
Application No.: US13114556Application Date: 2011-05-24
-
Publication No.: US08212304B2Publication Date: 2012-07-03
- Inventor: Mitsuaki Osame , Hiroyuki Miyake , Aya Miyazaki , Shunpei Yamazaki
- Applicant: Mitsuaki Osame , Hiroyuki Miyake , Aya Miyazaki , Shunpei Yamazaki
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2006-101219 20060331
- Main IPC: H01L29/76
- IPC: H01L29/76

Abstract:
To provide a method of releasing charges which have been injected into charge accumulating layers of nonvolatile memory elements without using a substrate terminal such as a p well or an n well, as a method for deleting data from a NAND-type nonvolatile memory. In the method for deleting data from the NAND-type nonvolatile memory, charges stored in a charge accumulating layer of a first nonvolatile memory element are released by applying a first potential to a bit line and a source line, a second potential to a control gate of the first nonvolatile memory element, and a third potential which is different from the second potential to a control gate of a second nonvolatile memory element.
Public/Granted literature
- US20110220983A1 METHOD FOR DELETING DATA FROM NAND TYPE NONVOLATILE MEMORY Public/Granted day:2011-09-15
Information query
IPC分类: