Invention Grant
US08212346B2 Method and apparatus for reducing semiconductor package tensile stress
有权
降低半导体封装拉伸应力的方法和装置
- Patent Title: Method and apparatus for reducing semiconductor package tensile stress
- Patent Title (中): 降低半导体封装拉伸应力的方法和装置
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Application No.: US12259357Application Date: 2008-10-28
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Publication No.: US08212346B2Publication Date: 2012-07-03
- Inventor: E. Todd Ryan , Holger Schuehrer , Seung-Hyun Rhee
- Applicant: E. Todd Ryan , Holger Schuehrer , Seung-Hyun Rhee
- Applicant Address: KY Grand Cayman
- Assignee: Global Foundries, Inc.
- Current Assignee: Global Foundries, Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Ingrassia Fisher & Lorenz, P.C.
- Main IPC: H01L23/06
- IPC: H01L23/06

Abstract:
A semiconductor package is provided having reduced tensile stress. The semiconductor package includes a package substrate and a semiconductor die. The semiconductor die is coupled electrically and physically to the package substrate and includes a stress relieving layer incorporated therein. The stress relieving layer has a predetermined structure and a predetermined location within the semiconductor die for reducing tensile stress of the semiconductor package during heating and cooling of the semiconductor package.
Public/Granted literature
- US20100102435A1 METHOD AND APPARATUS FOR REDUCING SEMICONDUCTOR PACKAGE TENSILE STRESS Public/Granted day:2010-04-29
Information query
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