Invention Grant
- Patent Title: System and method for on-chip duty cycle measurement
- Patent Title (中): 片上占空比测量的系统和方法
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Application No.: US12507686Application Date: 2009-07-22
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Publication No.: US08212547B2Publication Date: 2012-07-03
- Inventor: Anurag Ramesh Tiwari , Kallol Chatterjee
- Applicant: Anurag Ramesh Tiwari , Kallol Chatterjee
- Applicant Address: NL Amsterdam
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Amsterdam
- Agency: Seed IP Law Group PLLC
- Priority: IN1741/DEL/2008 20080724
- Main IPC: G01R23/175
- IPC: G01R23/175 ; G01R35/00 ; H03H11/26

Abstract:
An apparatus and method for measuring the duty cycle of a clock signal, the apparatus having a first multi-tap delay module, a second multi-tap delay module, and a multi-element detecting module, the input terminal of the first multi-tap delay module and the input terminal of the second multi-tap delay module coupled to an input node IN, the first multi-tap delay module receiving the clock signal and then providing it a first constant incremental delay at each tap, the second multi-tap delay module receiving the same clock signal CLK and then providing it a second constant incremental delay at each tap, and the multi-element detecting module determining the ratio of the number of outputs of the multi-element detecting module in which the sampled clock level is high with respect to the total number of steps covering one complete clock cycle.
Public/Granted literature
- US20100019757A1 SYSTEM AND METHOD FOR ON-CHIP DUTY CYCLE MEASUREMENT Public/Granted day:2010-01-28
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