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US08212547B2 System and method for on-chip duty cycle measurement 有权
片上占空比测量的系统和方法

System and method for on-chip duty cycle measurement
Abstract:
An apparatus and method for measuring the duty cycle of a clock signal, the apparatus having a first multi-tap delay module, a second multi-tap delay module, and a multi-element detecting module, the input terminal of the first multi-tap delay module and the input terminal of the second multi-tap delay module coupled to an input node IN, the first multi-tap delay module receiving the clock signal and then providing it a first constant incremental delay at each tap, the second multi-tap delay module receiving the same clock signal CLK and then providing it a second constant incremental delay at each tap, and the multi-element detecting module determining the ratio of the number of outputs of the multi-element detecting module in which the sampled clock level is high with respect to the total number of steps covering one complete clock cycle.
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