Invention Grant
US08212566B2 Angular position sensing based on magnetically induced beam deformation 有权
基于磁感应波束变形的角位置检测

Angular position sensing based on magnetically induced beam deformation
Abstract:
A sensor for sensing an angular position of an instrument relative to a static magnetic field includes a flexible beam, an electromagnetic device, and a measuring device. The beam at one end may be coupled to the instrument, and lies along a sensor axis when the beam is in a non -flexed state. The electromagnetic device is coupled to the beam and is configured for generating a magnetic sensor field aligned with the sensor axis. The measuring device communicates with the beam and is configured for measuring a property of the beam related to an amount of flexure of the beam. The sensor may be utilized to set the instrument at a desired angle prior to operating the instrument, and to determine whether the instrument has deviated from the desired angle during operation. The instrument may include a probe spinning module such as may be utilized in magnetic resonance experiments.
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