Invention Grant
- Patent Title: Electromagnetic compatibility multi-carrier immunity testing system and method
- Patent Title (中): 电磁兼容性多载波抗扰度测试系统及方法
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Application No.: US12506684Application Date: 2009-07-21
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Publication No.: US08212572B2Publication Date: 2012-07-03
- Inventor: Patrick W. Webb
- Applicant: Patrick W. Webb
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood
- Main IPC: G01R27/28
- IPC: G01R27/28

Abstract:
Provided for in some embodiments is, a method of electromagnetic compatibility multi-carrier immunity testing. The method includes generating a first carrier frequency set including a first plurality of carrier frequencies simultaneously such that a device under test is subjected to the first plurality of carrier frequencies simultaneously. One or more of the first plurality of carrier frequencies is substantially different from other ones of the first plurality of carrier frequencies such that the first plurality of carrier frequencies do not interfere with one another when they are generated simultaneously, and intermodulation products of the first plurality of carrier frequencies are not significant relative to the first plurality of carrier frequencies when the first plurality of carrier frequencies are generated simultaneously.
Public/Granted literature
- US20110018553A1 Electromagnetic Compatibility Multi-Carrier Immunity Testing System and Method Public/Granted day:2011-01-27
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