Invention Grant
- Patent Title: High frequency analysis of a device under test
- Patent Title (中): 被测设备的高频分析
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Application No.: US12354545Application Date: 2009-01-15
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Publication No.: US08212573B2Publication Date: 2012-07-03
- Inventor: Mohamed Ahmed AbouKhousa , Reza Zoughi , Sergiy Kharkivskiy
- Applicant: Mohamed Ahmed AbouKhousa , Reza Zoughi , Sergiy Kharkivskiy
- Applicant Address: US MO Columbia
- Assignee: The Curators of the University of Missouri
- Current Assignee: The Curators of the University of Missouri
- Current Assignee Address: US MO Columbia
- Agency: Senniger Powers LLP
- Main IPC: G01R27/04
- IPC: G01R27/04

Abstract:
Analyzing a device under test (“DUT”) at higher frequencies. A phase shifter varies the phase of a standing wave on a transmission line coupled to the DUT. The standing wave magnitude is sampled at each of the phase shifts and one or more DUT characteristics are determined as a function of the sampled magnitudes and phase shifts. Further aspects include a related phase shifter comprising a waveguide having a plurality of sub-resonant slots formed therein and having active elements for loading the slots to control the phase shift applied to the signal.
Public/Granted literature
- US20100176789A1 HIGH FREQUENCY ANALYSIS OF A DEVICE UNDER TEST Public/Granted day:2010-07-15
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