Invention Grant
- Patent Title: Device for analyzing size and location of conductive item
- Patent Title (中): 用于分析导电物品的尺寸和位置的装置
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Application No.: US12344803Application Date: 2008-12-29
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Publication No.: US08212575B2Publication Date: 2012-07-03
- Inventor: David Thomas Shadwick
- Applicant: David Thomas Shadwick
- Applicant Address: US KY Lexington
- Assignee: Lexmark International, Inc.
- Current Assignee: Lexmark International, Inc.
- Current Assignee Address: US KY Lexington
- Main IPC: G01N27/04
- IPC: G01N27/04 ; B41J29/393 ; G01N15/02

Abstract:
A matrix analyzer for determining the size and location of a conductive item placed thereon. The matrix analyzer includes plural row conductors and column conductors with a corresponding grid of conductive areas exposed on the surface of the matrix analyzer. When a conductive item, such as an ink droplet, is jetted onto the matrix analyzer, the intersection of various row conductors and column conductors exhibit a low resistance. The rows and columns of the matrix analyzer can be sequentially accessed to find those intersections where the low resistance exists. From such data, the size and location of the ink droplets can be determined.
Public/Granted literature
- US20100162796A1 Device for Analyzing Size and Location of Conductive Item Public/Granted day:2010-07-01
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