Invention Grant
- Patent Title: Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel
- Patent Title (中): TFT液晶面板的物理性质测量方法和TFT液晶面板的物理测量装置
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Application No.: US13021915Application Date: 2011-02-07
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Publication No.: US08212582B2Publication Date: 2012-07-03
- Inventor: Masaru Inoue , Kunihiko Sasaki , Takashi Kurihara , Yasuhiro Kume
- Applicant: Masaru Inoue , Kunihiko Sasaki , Takashi Kurihara , Yasuhiro Kume
- Applicant Address: JP Tokyo JP Osaka-shi
- Assignee: TOYO Corporation,Sharp Kabushiki Kaisha
- Current Assignee: TOYO Corporation,Sharp Kabushiki Kaisha
- Current Assignee Address: JP Tokyo JP Osaka-shi
- Agency: Baker & Hostetler LLP
- Priority: JP2007-015223 20070125
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.
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